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Thickness and overall size of the crystal blank are important factors to define characteristic features of the crystal oscillator.
The relationship between thickness of crystal blank and crystal oscillator is that the higher frequency of the crystal oscillator, the thicker the crystal blank is and vice versa.

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MTEC uses the most common crystal AT-cut to produce crystal blanks.
Artificial crystal standard cutting angular accuracy is plus minus 7.5awxibs ~ plus minus 2 minute.

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MTEC produces small crystal blanks for SMD crystal units and high frequency wave polish blanks. We excel at surface reformulation process, such as bevel process and polish process. We produce high electrical characteristic crystal blanks.
Bevel Process
Bevel process is the way of the molding process to polish and reprocess by spinning crystal tips.
Polish Process
Polish process is used to polish surface of crystal blank to a mirror gloss.
Friction is likely to be created on the surface of mirrored crystal blanks. Therefore, we require high process skill to prevent stress-stain from the polish process.


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| Package size | 7050 | 3225 | 2520 | 2016 |
|---|---|---|---|---|
| Item [MHz] | 3rd 155.520 156.250 164.328 187.468 190.000 195.000 200.000 212.500 |
1st 16.000 16.384 19.200 20.000 24.000 26.000 32.000 40.000 |
1st 20.000 25.000 26.000 27.000 32.000 36.000 38.400 40.000 |
1st 22.000 24.000 26.000 27.000 32.000 38.400 40.000 44.000 |
| AT-cut | plus minus 7.5awxibs ~ plus minus 2 minute | |||
| Main blank size | 4.4×1.8 | 2.0×1.3 | 1.6×1.1 | 1.3×0.9 |
| Surface finish | #4000 Etching Polish Process |
#4000 Etching Polish Process Bevel Process |
#4000 Etching Polish Process Bevel Process |
#4000 Etching Polish Process Bevel Process |
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| Polish equipment 9B/9.6B/6B/6.4B/4B/4.3B |
| Cutoff equipment Multi wire saw machine |
| Process equipment High-speed bevel process equipment |
| Surface processing devices Automatic etching treatment equipment |
| Inspection devices Automatic frequency classificatory devices, Manual frequency measuring machine, Bevel figure measure, Microscope, Profile projector, Surface roughness measure, X-ray automatic angular measure. |
